有效位数
现场可编程门阵列
可重构性
计算机科学
计算机硬件
逐次逼近ADC
校准
电子工程
嵌入式系统
电容器
工程类
物理
电气工程
电压
CMOS芯片
量子力学
电信
作者
Songqin Liu,Zibing Wu,Weiwei Xu,Kun Hu
出处
期刊:IEEE Transactions on Nuclear Science
[Institute of Electrical and Electronics Engineers]
日期:2024-01-17
卷期号:71 (3): 309-315
被引量:1
标识
DOI:10.1109/tns.2024.3355239
摘要
A soft-core analog-to-digital converter (ADC) based on multichain merged time-to-digital converter (TDC) is proposed. In hardware design, it only requires one resistor and a field-programmable gate array (FPGA). The soft-core ADC is implemented in the FPGA. The FPGA-based ADC (FPGA-ADC) needs to be calibrated including TDC length calibration, TDC alignment calibration, and TDC-to-ADC code calibration. We implement the FPGA-ADCs with 1-, 2-, 4-, 6-, and 8-chain merged TDC. The resulting FPGA-ADC can achieve a best resolution of more than 10 bits and a best 6.7 bits effective number of bits (ENOB) over a 0.67–2.03 V input dynamic range at a 200 MS/s sampling rate. The advantages of the proposed soft-core ADC are its compact size, reconfigurability, and high resolution, which provide a feasible approach to achieve different readout electronics system on single hardware platform.
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