溅射
材料科学
离子束
离子
辐照
锗
通量
航程(航空)
梁(结构)
原子物理学
光电子学
硅
薄膜
纳米技术
光学
复合材料
化学
核物理学
物理
有机化学
作者
Naoto Oishi,Tatsuya Yasuoka,Toshiyuki Kawaharamura,Noriko Nitta
出处
期刊:Journal of vacuum science & technology
[American Vacuum Society]
日期:2023-09-05
卷期号:41 (6)
被引量:1
摘要
Nanostructuring via ion beam irradiation on Ge substrates can be activated by ion beam sputtering and self-organization of point defects (SPDs). For evaluating the mechanism by which these formation factors compete, we studied nanostructuring on Ge substrates subjected to sputtering-dominant conditions, viz., the low-energy ion incidence. A focused ion beam was used for nanostructuring and adjusting an angle of ion incidence to the surface normal range of 0°–60°. The ions accelerated for irradiation were Ga+ with an incident energy of 5–30 keV, and the fluence and beam current were 1 × 1020–1 × 1022 ions/m2 and 0.5–16.7 nA, respectively. Based on the results of serial experiments, the incident energy of 5 keV can be the threshold for the activation of nanostructuring by SPD.
科研通智能强力驱动
Strongly Powered by AbleSci AI