亮度
过采样
弹丸
单发
一次性
校准
像素
人工智能
计算机视觉
计算机科学
样品(材料)
采样(信号处理)
准确度和精密度
计算机图形学(图像)
光学
数学
物理
工程类
统计
材料科学
带宽(计算)
电信
机械工程
滤波器(信号处理)
冶金
热力学
作者
Ingo Rotscholl,Bob Liu,U. Krüger
摘要
In this contribution, we present and validate a DeMURA procedure using a one‐shot approach that does not require massive oversampling. It bases on on‐site calibration of the imaging condition in the setup by a specific teach pattern. It has only to be performed for the first sample. Slight misalignments of following displays are then automatically corrected. After that, the luminance of each display can be measured with a single measurement. The proposed method has the potential to facilitate high‐precision calibration of pixel‐level luminance under much more relaxed sampling conditions and higher speed compared to current methods.
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