石墨烯
材料科学
俄歇电子能谱
污染
低能电子衍射
单层
金属
石墨烯泡沫
氧化石墨烯纸
电子衍射
图层(电子)
基质(水族馆)
纳米技术
石墨烯纳米带
化学工程
复合材料
衍射
冶金
光学
生态学
物理
工程类
核物理学
生物
海洋学
地质学
作者
George H. Wells,Michael Hunt,T. Hopf,Konstantin Vassilevski,Enrique Escobedo‐Cousin,Alton B. Horsfall,Jonathan P. Goss,A.G. O’Neill
出处
期刊:Journal of vacuum science and technology
[American Vacuum Society]
日期:2015-08-11
卷期号:33 (5)
被引量:2
摘要
Metal contamination deposited on few-layer graphene (3 ± 1 monolayers) grown on SiC(0001) was successfully removed from the surface, using low cost adhesive tape. More than 99% of deposited silver contamination was removed from the surface via peeling, causing minimal damage to the graphene. A small change in the adhesion of graphene to the SiC(0001) substrate was indicated by changes observed in pleat defects on the surface; however, atomic resolution images show the graphene lattice remains pristine. Thin layers of contamination deposited via an electron gun during Auger electron spectroscopy/low energy electron diffraction measurements were also found to be removable by this technique. This contamination showed similarities to “roughened” graphene previously reported in the literature.
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