光学
全息术
斑点图案
数值孔径
镜头(地质)
数字全息显微术
散射
显微镜
参考光束
干扰(通信)
分辨率(逻辑)
折射
材料科学
物理
计算机科学
人工智能
电信
频道(广播)
波长
作者
YoonSeok Baek,KyeoReh Lee,YongKeun Park
出处
期刊:Physical review applied
[American Physical Society]
日期:2018-08-31
卷期号:10 (2)
被引量:23
标识
DOI:10.1103/physrevapplied.10.024053
摘要
High-resolution imaging at long working distances is very important in optical microscopy, providing great freedom in sample and imaging conditions. However, this is challenging for a conventional refraction-based optical lens, due to optical aberrations. The authors propose a microscopic technique based on multiple scattering of light instead of refractive optics, where the complex amplitude of light is retrieved using a scattering layer. This approach will impact engineering solutions for high-resolution long-working-distance imaging in optical microscopy, and can be extended to holography for $e.g.$ particle tracking or cell pathology.
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