Masihhur R. Laskar,Digbijoy N. Nath,Lu Ma,Edwin W. Lee,Choong Hee Lee,Thomas F. Kent,Zihao Yang,Rohan Mishra,Manuel A. Roldán,Juan Carlos Idrobo,Sokrates T. Pantelides,Stephen J. Pennycook,Roberto C. Myers,Yiying Wu,Siddharth Rajan
出处
期刊:Applied Physics Letters [American Institute of Physics] 日期:2014-03-03卷期号:104 (9): 092104-092104被引量:282
标识
DOI:10.1063/1.4867197
摘要
We report on the first demonstration of p-type doping in large area few-layer films of (0001)-oriented chemical vapor deposited MoS2. Niobium was found to act as an efficient acceptor up to relatively high density in MoS2 films. For a hole density of 3.1 × 1020 cm−3, Hall mobility of 8.5 cm2 V−1 s−1 was determined, which matches well with the theoretically expected values. X-ray diffraction scans and Raman characterization indicated that the film had good out-of-plane crystalline quality. Absorption measurements showed that the doped sample had similar characteristics to high-quality undoped samples, with a clear absorption edge at 1.8 eV. Scanning transmission electron microscope imaging showed ordered crystalline nature of the Nb-doped MoS2 layers stacked in the [0001] direction. This demonstration of substitutional p-doping in large area epitaxial MoS2 could help in realizing a wide variety of electrical and opto-electronic devices based on layered metal dichalcogenides.