亲爱的研友该休息了!由于当前在线用户较少,发布求助请尽量完整地填写文献信息,科研通机器人24小时在线,伴您度过漫漫科研夜!身体可是革命的本钱,早点休息,好梦!

Bulk and surface passivation of silicon solar cells accomplished by silicon nitride deposited on industrial scale by microwave PECVD

钝化 氮化硅 材料科学 等离子体增强化学气相沉积 光电子学 晶体硅 薄脆饼 太阳能电池 图层(电子) 纳米技术
作者
W.J. Soppe,H.C. Rieffe,A.W. Weeber
出处
期刊:Progress in Photovoltaics [Wiley]
卷期号:13 (7): 551-569 被引量:141
标识
DOI:10.1002/pip.611
摘要

Progress in Photovoltaics: Research and ApplicationsVolume 13, Issue 7 p. 551-569 Research Bulk and surface passivation of silicon solar cells accomplished by silicon nitride deposited on industrial scale by microwave PECVD Wim Soppe, Corresponding Author Wim Soppe [email protected] Energy Research Centre of the Netherlands, ECN, P.O. Box 1, 1755 ZG Petten, The NetherlandsEnergy Research Centre of the Netherlands (ECN), PO Box 1, 1755 ZG Petten, The Netherlands.===Search for more papers by this authorHenk Rieffe, Henk Rieffe Energy Research Centre of the Netherlands, ECN, P.O. Box 1, 1755 ZG Petten, The NetherlandsSearch for more papers by this authorArthur Weeber, Arthur Weeber Energy Research Centre of the Netherlands, ECN, P.O. Box 1, 1755 ZG Petten, The NetherlandsSearch for more papers by this author Wim Soppe, Corresponding Author Wim Soppe [email protected] Energy Research Centre of the Netherlands, ECN, P.O. Box 1, 1755 ZG Petten, The NetherlandsEnergy Research Centre of the Netherlands (ECN), PO Box 1, 1755 ZG Petten, The Netherlands.===Search for more papers by this authorHenk Rieffe, Henk Rieffe Energy Research Centre of the Netherlands, ECN, P.O. Box 1, 1755 ZG Petten, The NetherlandsSearch for more papers by this authorArthur Weeber, Arthur Weeber Energy Research Centre of the Netherlands, ECN, P.O. Box 1, 1755 ZG Petten, The NetherlandsSearch for more papers by this author First published: 25 April 2005 https://doi.org/10.1002/pip.611Citations: 127AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat Abstract Bulk and surface passivation by silicon nitride has become an indispensable element in industrial production of multicrystalline silicon (mc-Si) solar cells. Microwave PECVD is a very effective method for high-throughput deposition of silicon nitride layers with the required properties for bulk and surface passivation. In this paper an analysis is presented of the relation between deposition parameters of microwave PECVD and material properties of silicon nitride. By tuning the process conditions (substrate temperature, gas flows, working pressure) we have been able to fabricate silicon nitride layers which fulfill almost ideally the four major requirements for mc-Si solar cells: (1) good anti-reflection coating (refractive index tunable between 2·0 and 2·3); (2) good surface passivation on p-type FZ wafers (Seff<30 cm/s); (3) good bulk passivation (improvement of IQE at 1000 nm by 30% after short thermal anneal); (4) long-term stability (no observable degradation after several years of exposure to sunlight). By implementing this silicon nitride deposition in an inline production process of mc-Si solar cells we have been able to produce cells with an efficiency of 16·5%. Finally, we established that the continuous deposition process could be maintained for at least 20 h without interruption for maintenance. On this timescale we did not observe any significant changes in layer properties or cell properties. This shows the robustness of microwave PECVD for industrial production. Copyright © 2005 John Wiley & Sons, Ltd. REFERENCES 1 Doshi P, Jellison GE, Rohatgi A. Characterization and optimization of absorbing PECVD antireflection coatings for silicon photovoltaics. Journal of Applied Optics 1997; 36: 7826. 2 Nagel H, Aberle AG, Hezel R. Optimised antireflection coatings for planar silicon solar cells using remote PECVD silicon nitride and porous silicon dioxide. Progress in Photovoltaics: Research and Applications 1999; 7: 245–260. 3 Winderbaum S, Yun F, Reinhold O. Application of plasma enhanced chemical vapor deposition silicon nitride as a double layer antireflection coating and passivation layer for polysilicon solar cells. Journal of Vacuum Science and Technology 1997; A15: 1020–1025. 4 Hezel R, Schörner R. Plasma silicon nitride—a promising dielectric to achieve high-quality silicon MIS/IL solar cells. Journal of Applied Physics 1981; 52: 3076. 5 Hezel R, Blumenstock K, Schörner R. Interface states and fixed charges in MNOS structures with APCVD and plasma silicon nitride. Journal of the Electrochemical Society 1984; 131: 1679. 6 Leguijt C. Surface Passivation for Silicon Solar Cells. Thesis, Utrecht University, 1995. 7 Schuurmans F. Surface Passivation of Silicon by PECVD Silicon Nitride. Thesis, Utrecht University, 1998. 8 Schmidt J. Untersuchungen zur Ladungsträgerrekombination and den Oberflächen und im Volumen von kristallinen Silicium-Solarzellen. Thesis, Hannover University, 1998. 9 Aberle AG, Hezel R. Progress in low-temperature surface passivation of silicon solar cells using remote-plasma silicon nitride. Progress in Photovoltaics: Research and Applications 1997; 5: 29–50. 10 Aberle AG. Crystalline Silicon Solar Cells: Advanced Surface Passivation and Analysis. The University of New South Wales, 1999. 11 Schmidt J, Aberle AG. Carrier recombination at silicon–silicon nitride interfaces fabricated by plasma-enhanced chemical vapor deposition. Journal of Applied Physics 1999; 85: 3626–3633. 12 Schmidt J, Kerr M. Highest-quality surface passivation of low-resistivity p-type silicon using stoichiometric PECVD silicon nitride. Solar Energy Materials and Solar Cells 2001; 65: 585–591. 13 Lenkeit B, Hezel R. Improved understanding of the surface-passivating properties of RPECVD silicon nitride on p-type crystalline silicon. Proceedings of the 17th European Photovoltaic Solar Energy Conference, Munich, Germany, 22–26 October 2001; 343–346. 14 Lenkeit B, Steckemetz S, Artuso F, Hezel R. Excellent thermal stability of remote plasma-enhanced chemical vapour deposited silicon nitride films for the rear of screen-printed bifacial silicon solar cells. Solar Energy Materials and Solar Cells 2001; 65: 317–323. 15 Mäckel H, Lüdemann R. Detailed study of the composition of hydrogenated SiNx layers for high-quality silicon surface passivation. Journal of Applied Physics 2002; 92: 2602–2609. 16 Cuevas A, Kerr M, Schmidt J. Passivation of crystalline silicon using silicon nitride. Proceedings of the 3rd World Conference on Photovoltaic Energy Conversion, Osaka, Japan, 11–18 May 2003; 913–918. 17 Kimura K. Recent developments in polycrystalline silicon solar cells. Technical Digest, International PVSEC-1, Kobe, November 1984; 3741. 18 Schmidt J, Kerr M, Cuevas A. Surface passivation of silicon solar cells using plasma-enhanced chemical-vapour-deposited SiN films and thin thermal SiO2/plasma SiN stacks. Semiconductor Science and Technology 2001; 16: 164–170. 19Mittelstädt L, Dauwe S, Metz A, Hezel R, Hässler C. Front and rear silicon-nitride-passivated multicrystalline silicon solar cells with an efficiency of 18·1%. Progress in Photovoltaics: Research and Applications 2002; 10: 35–39. 20 Chen Z, Rohatgi A, Bell RO, Kalejs JP. Defect passivation in multicrystalline-Si materials by plasma-enhanced chemical vapor deposition of SiO2/SiN coatings. Applied Physics Letters 1994; 65: 2078–2080. 21 Duerinckx F. Bulk and surface passivation of screen printed multicrystalline silicon solar cells based on plasma enhanced CVD of silicon nitride. Thesis, Leuven University, 1999. 22 Einhaus R, Duerinckx F, Van Kerschaver E, Szlufcik J, Durand F, Riberyron PJ, Duby JC, Sarti D, Goaer G, Le GN, Périchaud I, Clerc L, Martinuzzi S. Hydrogen passivation of newly developed EMC-multi-crystalline silicon. Materials Science and Engineering 1999; B58: 81–85. 23 Jeong JW, Rosenblum MD, Kalejs JP, Rohatgi A. Hydrogenation of defects in edge-defined film-fed grown aluminum-enhanced plasma enhanced chemical vapor deposited silicon nitride multicrystalline silicon. Journal of Applied Physics 2000; 87: 7551–7557. 24 Soppe W, Weeber A, De Moor H, Sinke W, Lauinger T, Auer R, Lenkeit B, Aberle A. Cost effective mc-Si processing by screenprinting on remote PECVD layers. Proceedings of the 2nd World Conference and Exhibition on Photovoltaic Solar Energy Conversion, Vienna, Austria, 6–10 July 1998; 1826–1828. 25 Soppe WJ, Devilee C, Schiermeier SEA, Hong J, Kessels WMM, Van De Sanden MCM, Arnoldbik WM, Weeber AW. Bulk and surface passivation by silicon nitride grown by remote microwave PECVD. Proceedings of the 17th European Photovoltaic Solar Energy Conference, Munich, Germany, 22–26 October 2001; 1543–1546. 26 Duerinckx F, Szlufcik J. Defect passivation of industrial multicrystalline solar cells based on PECVD silicon nitride. Solar Energy Materials and Solar Cells 2002; 72: 231–246. 27 Geerligs LJ, Azzizi A, Macdonald DH, Manshanden P. Hydrogen passivation of iron in multicrystalline silicon. Proceedings of the 13th Workshop on Crystalline Silicon Solar Cell Materials and Processes, Colorado, USA, 10–13 August 2003; 199–202. 28 Pankove JI, Johnson NM. Hydrogen in Semiconductors. Academic Press: New York, 1991. 29 Sopori BL, Deng X, Benner JP, Rohatgi A, Sana P, Estreicher SK, Park YK, Roberson MA. Hydrogen in silicon: a discussion of diffusion and passivation mechanisms. Solar Energy Materials and Solar Cells 1996; 41/42: 159–169. 30 Nickel NH, Kaiser I. Hydrogen migration in phosphorous doped polycrystalline silicon. Materials Research Society Symposium Proceedings 1998; 513: 165–170. 31 Boehme C, Lucovsky G. H loss mechanism during anneal of silicon nitride: chemical dissociation. Journal of Applied Physics 2000; 88: 6055–6059. 32 Sopori B, Zhang Y, Ravindra NM. Silicon device processing in H-ambients: H-diffusion mechanisms and influence on electronic properties. Journal of Electronic Materials 2001; 30: 1616–1627. 33 Rohatgi A, Yelundur V, Jeong J, Ebong A, Rosenblum MD, Hanoka JI. Fundamental understanding and implementation of Al-enhanced PECVD SiNx hydrogenation in silicon ribbons. Solar Energy Materials and Solar Cells 2002; 74: 117–126. 34 Hong J, Kessels WMM, Soppe WJ, Weeber AW, Arnoldbik WM, Van De Sanden MCM. Influence of the high-temperature 'firing' step on high-rate plasma deposited silicon nitride films used as bulk passivating antireflection coatings on silicon solar cells. Journal of Vacuum Science Technology B 2003; 21: 2123–2132. 35 Job R, Fahrner WR, Kazuchits NM, Ulyashin AG. A two-step low-temperature process for a p–n junction formation due to hydrogen enhanced thermal donor formation in p-type Czochralski silicon. Materials Research Society Symposium Proceedings 1998; 513: 337–342. 36 Rashkeev SN, Di Ventra M, Pantelides ST. Hydrogen passivation and activation of oxygen complexes in silicon. Applied Physics Letters 2001; 78: 1571–1573. 37 Aberle AG, Lauinger T, Hezel R. Remote PECVD silicon nitride—a key technology for the crystalline silicon PV industry of the 21st century? Proceedings of the 14th European Photovoltaic Solar Energy Conference, Barcelona, Spain, 30 June–4 July 1997; 684–689. 38 Soppe WJ, Duijvelaar BG, Schiermeier SEA, Weeber AW, Steiner A, Schuurmans FM. A high-throughput PECVD reactor for deposition of passivating SiN layers. Proceedings of the 16th European Photovoltaic Solar Energy Conference, Glasgow, UK, 1–5 May 2000; 1420–1423. 39 Schitthelm F, Völk P, Dekkers H, Szlufcik J. Quasi continuous a-SiN:H-PECVD system with high throughput rate for solar cell AR-coating. Proceedings of the 16th European Photovoltaic Solar Energy Conference, Glasgow, UK, 1–5 May 2000; 1609–1612. 40 Coates K, Morrison S, Narayanan S, Madan A. Deposition of silicon nitride to improve the conversion efficiency of multicrystalline silicon solar cells. Proceedings of the 16th European Photovoltaic Solar Energy Conference, Glasgow, UK, 1–5 May 2000; 1279–1281. 41 http://www.otb.nl/Media/Leaflet_DEPx_met_foto.pdf 42 Von Aichberger S. Deeper than blue. Market survey on deposition systems for silicon nitride. Photon International 2003; 3: 50–55. 43 Culik JS, Faller F, Goncharovsky IS, Rand JA, Barnett AM. Progress on 15 MW single thread silicon-filmTM solar cell manufacturing systems. Proceedings of the 17th European Photovoltaic Solar Energy Conference, Munich, Germany, 22–26 October 2001; 1347–1350. 44 Nybergh K. Using factorial design and response surface methodology to optimize growth parameters of PECVD grown silicon nitride. Physica Scripta 1999; T79: 266–271. 45 Moisan M, Pelletier J. Microwave Exited Plasmas. Elsevier: Amsterdam, 1992; 123–180. 46 Lieberman MA, Lichtenberg AJ. Principles of Plasma Discharges and Materials Processing. Wiley: New York, 1994. 47 Petasch W, Räuchle E, Muegge H, Muegge K. Duo plasmaline—a linearly extended homogeneous low pressure plasma source. Surface and Coatings Technology 1997; 93: 112–118. 48 Räuchle E. Duo-plasmaline, a surface wave sustained linearly extended discharge. Journal de Physique IV France 1998; 8(Pr7): 99–107. 49 Lauinger T, Moschner J, Aberle AG, Hezel R. Optimization and characterization of remote plasma-enhanced chemical vapor deposition silicon nitride for the passivation of p-type crystalline surfaces. Journal of Vacuum Science and Technology A 1998; 16: 530–543. 50 Smith DL. Plasma deposition of SiNxHy: process chemistry vs film properties. Materials Research Society Symposium Proceedings 1990; 165: 69–77. 51 Hanyaloglu BF, Aydil ES. Low temperature plasma deposition of silicon nitride from silane and nitrogen plasmas. Journal of Vacuum Science and Technology 1998; A16: 2794–2803. 52 Kessels WMM, Van Assche FJH, Hong J, Schramm DC, Van De Sanden MCM. Plasma diagnostic study of silicon nitride film growth in a remote Ar-H2-N2-SiH4 plasma: role of N and SiHn radicals. Journal of Vacuum Science and Technology A 2004; 22: 96–106. 53 Robertson J. Electronic structure of silicon nitride. Philosophical Magazine B 1991; 63: 47–77. 54 Giorgis F, Giuliani F, Pirri CF, Tesso E. Optical, structural and electrical properties of device quality hydrogenated amorphous silicon-nitrogen films deposited by plasma-enhanced chemical vapour deposition. Philosophical Magazine B 1998; 77: 925–944. 55 Rieffe HC, Soppe WJ, Kessels WMM, Van De Sanden MCM, Weeber AW. Passivation on mc-Si solar cells with PECVD SiNx:H using N2 and SiH4. Proceedings of PV in Europe from PV Technology to Energy Solutions, Rome, Italy, 7–11 October 2002; 295–298. 56 Sinton RA, Cuevas A. Contactless determination of current—voltage characteristics and minority-carrier lifetimes in semiconductors from quasi-steady-state photoconductance data. Applied Physics Letters 1996; 69: 2510–2512. 57 Moschner JD, Henze J, Schmidt J, Hezel R. High-quality surface passivation of silicon solar cells in an industrial-type inline plasma silicon nitride deposition system. Progress in Photovoltaics: Research and Applications 2004; 12: 21–31. 58 Shanks HR, Lye L. Formation of pin holes in hydrogenated amorphous silicon at high temperatures and the yield strength of a-Si:H. Journal of Applied Physics 1981; 52: 811–813. 59 Hauser A, Spiegel M, Fath P, Bucher E. Influence of an ammonia activation prior to the PECVD SiN deposition on the solar cell performance. Solar Energy Materials and Solar Cells 2003; 75: 357–362. 60 http://www.statgraphics.com 61 Weeber AW, Sinke WC. Statistical analysis for solar cell research. Proceedings of the 25th IEEE, Washington DC, 1996; 565. 62 IEC 61215. Crystalline silicon terrestrial photovoltaic (PV) modules—Design qualification and type approval 1993. 63 Chianese D, Realini A, Cereghetti N, Rezzonico S, Bura E, Friesen G, Bernasconi A. Analysis of weathered c-Si PV modules. Proceedings of the 3rd World Conference on Photovoltaic Energy Conversion, Osaka, Japan, 11–18 May 2003; 2922–2926. Citing Literature Volume13, Issue7November 2005Pages 551-569 ReferencesRelatedInformation
最长约 10秒,即可获得该文献文件

科研通智能强力驱动
Strongly Powered by AbleSci AI
更新
PDF的下载单位、IP信息已删除 (2025-6-4)

科研通是完全免费的文献互助平台,具备全网最快的应助速度,最高的求助完成率。 对每一个文献求助,科研通都将尽心尽力,给求助人一个满意的交代。
实时播报
CRUSADER完成签到,获得积分10
刚刚
55秒前
1分钟前
充电宝应助wanli采纳,获得10
1分钟前
1分钟前
桐桐应助jarrykim采纳,获得10
1分钟前
2分钟前
2分钟前
2分钟前
John完成签到 ,获得积分10
2分钟前
2分钟前
3分钟前
3分钟前
jarrykim发布了新的文献求助10
3分钟前
大个应助啊呆哦采纳,获得10
3分钟前
3分钟前
啊呆哦完成签到,获得积分10
3分钟前
在水一方应助sidneyyang采纳,获得10
3分钟前
啊呆哦发布了新的文献求助10
3分钟前
3分钟前
3分钟前
4分钟前
4分钟前
4分钟前
4分钟前
4分钟前
4分钟前
5分钟前
吴南宛发布了新的文献求助10
5分钟前
sidneyyang完成签到,获得积分10
5分钟前
211JZH完成签到 ,获得积分10
5分钟前
量子星尘发布了新的文献求助10
5分钟前
5分钟前
5分钟前
5分钟前
5分钟前
5分钟前
直率的笑翠完成签到 ,获得积分10
5分钟前
sidneyyang发布了新的文献求助10
5分钟前
6分钟前
高分求助中
(应助此贴封号)【重要!!请各用户(尤其是新用户)详细阅读】【科研通的精品贴汇总】 10000
SOFT MATTER SERIES Volume 22 Soft Matter in Foods 1000
Zur lokalen Geoidbestimmung aus terrestrischen Messungen vertikaler Schweregradienten 1000
Rapid synthesis of subnanoscale high-entropy alloys with ultrahigh durability 666
Storie e culture della televisione 500
Selected research on camelid physiology and nutrition 500
《2023南京市住宿行业发展报告》 500
热门求助领域 (近24小时)
化学 医学 生物 材料科学 工程类 有机化学 内科学 生物化学 物理 计算机科学 纳米技术 遗传学 基因 复合材料 化学工程 物理化学 病理 催化作用 免疫学 量子力学
热门帖子
关注 科研通微信公众号,转发送积分 4889441
求助须知:如何正确求助?哪些是违规求助? 4173461
关于积分的说明 12952082
捐赠科研通 3934886
什么是DOI,文献DOI怎么找? 2159100
邀请新用户注册赠送积分活动 1177437
关于科研通互助平台的介绍 1082254