石墨烯
材料科学
氧化物
基质(水族馆)
氧化石墨烯纸
电介质
石墨烯纳米带
光电子学
硅
氧化硅
纳米技术
复合材料
冶金
氮化硅
海洋学
地质学
作者
Inhwa Jung,Jong-Soo Rhyee,Jong Yeog Son,Rodney S. Ruoff,Kyong Yop Rhee
出处
期刊:Nanotechnology
[IOP Publishing]
日期:2012-01-20
卷期号:23 (2): 025708-025708
被引量:43
标识
DOI:10.1088/0957-4484/23/2/025708
摘要
We investigated the colors of graphene and graphene-oxide multilayers that were deposited on various dielectric layers. In particular, the effects of the material thickness, the types of dielectric layers, and the existence of a back silicon substrate were analyzed. The colors of graphene-oxide layers on a SiO2/Si substrate were found to periodically change as the material thickness increased. However, the colors of graphene layers on the same substrate became saturated without a similar periodic change. The calculated colors corresponding to the material thicknesses were verified by optical microscopy and profilometry. We believe that these results demonstrate the possibility of utilizing color as a simple tool for detecting and estimating the thicknesses of graphene and graphene-oxide multilayers.
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