弯曲分子几何
衍射
薄脆饼
光学
同步加速器
X射线晶体学
材料科学
变形(气象学)
仪表(计算机编程)
工作(物理)
Crystal(编程语言)
结晶学
物理
计算机科学
纳米技术
化学
复合材料
操作系统
热力学
程序设计语言
作者
A. Honkanen,Simo Huotari
出处
期刊:IUCrJ
[International Union of Crystallography]
日期:2021-01-01
卷期号:8 (1): 102-115
被引量:9
标识
DOI:10.1107/s2052252520014165
摘要
Toroidally and spherically bent single crystals are widely employed as optical elements in hard X-ray spectrometry at synchrotron and free-electron laser light sources, and in laboratory-scale instruments. To achieve optimal spectrometer performance, a solid theoretical understanding of the diffraction properties of such crystals is essential. In this work, a general method to calculate the internal stress and strain fields of toroidally bent crystals and how to apply it to predict their diffraction properties is presented. Solutions are derived and discussed for circular and rectangular spherically bent wafers due to their prevalence in contemporary instrumentation.
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