材料科学
制作
发光二极管
光电子学
基质(水族馆)
蓝宝石
图层(电子)
热膨胀
纳米技术
复合材料
光学
激光器
物理
病理
地质学
医学
海洋学
替代医学
作者
Fengyi Jiang,Jianli Zhang,Qian Sun,Zhijue Quan
出处
期刊:Solid state lighting technology and application series
日期:2019-01-01
卷期号:: 133-170
被引量:9
标识
DOI:10.1007/978-3-319-99211-2_4
摘要
Fabrication of GaN LEDs on Si is an attractive work but also with great challenge. One needs to overcome the huge difference in lattice parameter and thermal expansion coefficient between GaN and Si. With the help of substrate patterning and AlN/AlGaN buffer layer technologies, stress can be well controlled and high-quality crack-free GaN with low dislocation density are successfully grown. By strain engineering and utilizing V-defect in the active region, high-efficiency LED structure is developed. The chip fabrication process of LED on Si substrate is totally different from that on sapphire substrate that yields a vertical thin film device structure which has many unique features.
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