材料科学
兴奋剂
薄膜
光电探测器
锑
铜
硫系化合物
硫化铜
基质(水族馆)
光电效应
光电子学
硫化物
量子效率
化学工程
纳米技术
冶金
地质学
海洋学
工程类
作者
Yarong Wang,Yufeng Shan,Wen Liu,Jichao Shi,Jingshan Hou,Guoying Zhao,Nianwei Dai,Feng Wang,Yongzheng Fang,Yufeng Liu
标识
DOI:10.1002/aelm.202300380
摘要
Abstract Ternary copper chalcogenide semiconductors made of copper antimony sulfide (CuSbS 2 ) are promising absorbers for high‐performance photoelectric devices due to their non‐toxic, abundant constituent elements and superior optoelectronic characteristics. However, the presence of a large number of Cu Sb antisite defects and atomic disorder suppress its performance in photodetection. Herein, a non‐vacuum, facile spin‐coating method based on an organic molecular precursor solution is employed to fabricate the preferable CuSbS 2 thin films. With the aid of good adhesion between precursor solution and substrate, compact CuSbS 2 thin films are in situ grown on the substrate. Meanwhile, the isoelectronic element of Ag‐doped CuSbS 2 thin films can be realized by introducing Ag of varying amounts in the precursor. As a result, the concentration of Cu Sb defects decreases monotonically as the ratio of Ag/(Ag + Cu) increases from 0% to 5%. Compared with the undoped CuSbS 2 device, the 5% Ag‐doped CuSbS 2 photodetector achieves the optimum responsibility ( R ) of 244.48 A W −1 , the external quantum efficiency ( EQE ) of 749.28% and the specific detectivity ( D* ) of 8.73 × 10 12 Jones, which are increased by 76.4, 76.5, and 38.0 times, respectively. This study provides a novel strategy to achieve high‐performance CuSbS 2 photodetectors by suppressing the Cu Sb inversion defects in the Ag‐doped thin film.
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