无损检测
微波成像
文艺复兴
工程类
系统工程
计算机科学
包络线(雷达)
钥匙(锁)
成像技术
光学(聚焦)
微波食品加热
电信
遥感
雷达
地质学
光学
物理
艺术
计算机安全
量子力学
艺术史
出处
期刊:Materials evaluation
[American Society for Nondestructive Testing]
日期:2023-09-01
卷期号:81 (9): 24-31
标识
DOI:10.32548/2023.me-04349
摘要
In the past four decades, microwave imaging has experienced a renaissance. This has happened because of new technology development, improved and robust image reconstruction algorithms, expansion of imaging modalities, and operational friendliness, particularly for nondestructive testing (NDT) applications (e.g., high-resolution, real-time, portable systems). Efforts to push the envelope forward continues. This paper provides a brief background on some of the key works that laid the foundation for these advancements. Next, the focus of the paper shifts to the author’s research group’s contributions to the field since the early 1990s to the present day in developing new imaging methodologies and tools specifically for NDT applications. This paper gives a chronology of these specific developments and illustrates how the desire to address NDT needs and requirements have kept these developmental processes moving forward.
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