Powder X-ray diffraction study of synthetic PdSn

Improved X-ray powder diffraction data for synthetic PdSn are reported. Powder diffraction data were collected with a laboratory X-ray source (Cu K α ) for Rietveld refinement. Refined crystallographic data for PdSn (orthorhombic, P n m a ) are a =6.1388(4), b =3.89226(3), c =6.3377(4) Å, V =151.43(2) Å 3 , Z =4, and D x =9.87 g∕cm 3 .