钙钛矿(结构)
材料科学
不稳定性
偏压
光伏系统
降级(电信)
离子
光电子学
纳米技术
透射电子显微镜
工程物理
化学物理
电压
计算机科学
化学
电气工程
结晶学
物理
机械
电信
工程类
有机化学
作者
Min-cheol Kim,Namyoung Ahn,Diyi Cheng,Mingjie Xu,So‐Yeon Ham,Xiaoqing Pan,Suk Jun Kim,Yanqi Luo,David P. Fenning,Darren H. S. Tan,Minghao Zhang,Guomin Zhu,Kiwan Jeong,Mansoo Choi,Ying Shirley Meng
出处
期刊:ACS energy letters
[American Chemical Society]
日期:2021-09-14
卷期号:6 (10): 3530-3537
被引量:16
标识
DOI:10.1021/acsenergylett.1c01707
摘要
Perovskite solar cells have drawn much attention recently owing to their world-record-setting photovoltaic performances, whereas their practicality is still limited by the structural instability that often arises from ion migration and defect formation. Despite the general understanding that ion instability is a primary cause for degradation, there is no observation of structural transformation at the atomistic scale. Such observation is crucial to understand how instabilities are induced by external perturbations such as illumination or electrical bias, allowing researchers to devise effective strategies to mitigate them. Here, we designed an in situ transmission electron microscopy setup to enable real-time observation of amorphization in perovskite materials under electrical biasing. To reverse the device performance degradation due to such structural changes, the samples were heated at 50 °C and were found to recrystallize, effectively regaining their performance losses. This work presents vital insights on understanding ion-migration phenomena and addressing instability challenges of perovskite optoelectronics.
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