NIST公司
太赫兹辐射
材料科学
太赫兹光谱与技术
计量学
测量不确定度
光学
光电子学
尺寸计量学
功率(物理)
工程类
电气工程
物理
计算机科学
量子力学
自然语言处理
作者
Bin Wu,Cheng Ping Ying,Heng fei Wang,Peng Zhang,Hongyuan Liu,Bin Jiang
摘要
Terahertz metrology is becoming more and more important along with the fast development of terahertz technology. This paper reviews the research works of the groups from the physikalisch-technische bundesanstalt (PTB), National institute of standards and technology (NIST), National physical laboratory (NPL), National institute of metrology (NIM) and some other research institutes. The contents mainly focus on the metrology of parameters of power, frequency, spectrum and pulse. At the end of the paper, the prospect of terahertz metrology is predicted.
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