材料科学
铟
薄膜晶体管
薄膜
镱
氧化物
掺杂剂
光电子学
水溶液
纳米
图层(电子)
纳米技术
化学工程
兴奋剂
复合材料
冶金
物理化学
化学
工程类
作者
Wangying Xu,Chuyu Xu,Liping Hong,Fei Xu,Chun Zhao,Yu Zhang,Ming Fang,Shun Han,Peijiang Cao,Yunxiang Lu,Wenjun Liu,Deliang Zhu
出处
期刊:Nanomaterials
[MDPI AG]
日期:2022-04-05
卷期号:12 (7): 1216-1216
被引量:2
摘要
We demonstrate the growth of ultra-thin (~5 nm) indium ytterbium oxide (In-Yb-O) thin film using a simple vacuum-free aqueous solution approach for the first time. The influences of Yb addition on the microstructural, chemical, optical, and electrical properties of In2O3 are well investigated. The analyses indicate that Yb dopant could suppress oxygen vacancy defects effectively owing to the lower standard electrode potential, lower electronegativity, and stronger metal-oxide bond strength than that of In. The optimized In-Yb-O thin-film transistors (TFTs) exhibit excellent electrical performance (mobility of 8 cm2/Vs and on/off ratio of ~108) and enhanced stability. The triumph of In-Yb-O TFTs is owing to the high quality In2O3 matrix, the remarkable suppressor of Yb, and the nanometer-thin and atomically smooth nature (RMS: ~0.26 nm) of channel layer. Therefore, the eco-friendly water-induced ultra-thin In-Yb-O channel provides an excellent opportunity for future large-scale and cost-effective electronic applications.
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