可靠性(半导体)
小尺寸
因子(编程语言)
随机存取存储器
计算机科学
扇出
材料科学
电子工程
形状系数(电子)
电气工程
光电子学
工程类
计算机硬件
物理
功率(物理)
量子力学
程序设计语言
薄脆饼
作者
Ki-Jun Sung,Kyoungtae Eun,Seowon Lee,Sungwon Yoon,Hwa–Young Son,Kangwook Lee
标识
DOI:10.1109/edtm55494.2023.10102966
摘要
FOWLP technology is one of the latest technologies to meet the requirements of small form-factor and high performance for mobile application. In this paper, a new VFO package has been introduced as the next generation platform based on FOWLP technology. This package has unique features of vertical wires on reconstructing stacked dies and multiple RDLs. VFO technology shows a thinner z-height with a stable package warpage, good thermal performance and an enhanced electrical characterization as well as a good reliability. Therefore, it will lead a small form factor and high performance memory application.
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