X射线
闪烁体
材料科学
光致变色
半导体
X射线探测器
光电子学
探测器
双模
化学
纳米技术
光学
物理
电子工程
工程类
作者
Xuying Yu,Jinxing Mi,Yang Han,Cai Sun,Mingsheng Wang,Guo‐Cong Guo
标识
DOI:10.1016/j.cclet.2023.109233
摘要
Direct X-ray detectors, which directly convert X-rays into electrical signals through semiconductors, have higher space solution than scintillator-mediated indirect X-ray ones and are high desirable for early cancer detection and other applications, but the mainstream commercial α-Se detector is still largely limited by high production costs, large leakage current and low stability. This article reports an easily prepared, stable radiochromic semiconductive metal–organic framework (MOF), (MV)[Cd3(tdc)4]∙2H2O (RCS-1, H2tdc = 2,5-thiophenedicarboxylic acid; MV2+ = methyl viologen cation) with direct X-ray detecting ability. With a large bulk resistivity of 8.40 × 109 Ω cm, this material ensures minimal dark current and low noise for X-ray detection. Additionally, it exhibits higher sensitivity to W Kα X-rays (98.58 μC Gy−1 cm−2) than α-Se (∼20 μC Gy−1 cm−2). Meanwhile, unlike most reported direct X-ray detecting semiconductors, compound RCS-1 shows remarkable color change upon X-ray irradiation owing to the presence of photochromism-active viologen cations. This feature offers an appealing visual detecting ability to direct X-ray detectors that provide only the electrical signals.
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