响应度
光电探测器
光电子学
材料科学
光电二极管
红外线的
异质结
波导管
氮化物
氮化硅
近红外光谱
光学
硅
物理
纳米技术
图层(电子)
作者
Rivka Gherabli,S.R.K. Chaitanya Indukuri,Roy Zektzer,Christian Frydendahl,Uriel Levy
标识
DOI:10.1038/s41377-023-01088-4
摘要
We demonstrate experimentally the realization and the characterization of a chip-scale integrated photodetector for the near-infrared spectral regime based on the integration of a MoSe2/WS2 heterojunction on top of a silicon nitride waveguide. This configuration achieves high responsivity of ~1 A W-1 at the wavelength of 780 nm (indicating an internal gain mechanism) while suppressing the dark current to the level of ~50 pA, much lower as compared to a reference sample of just MoSe2 without WS2. We have measured the power spectral density of the dark current to be as low as ~1 × 10-12 A Hz-0.5, from which we extract the noise equivalent power (NEP) to be ~1 × 10-12 W Hz-0.5. To demonstrate the usefulness of the device, we use it for the characterization of the transfer function of a microring resonator that is integrated on the same chip as the photodetector. The ability to integrate local photodetectors on a chip and to operate such devices with high performance at the near-infrared regime is expected to play a critical role in future integrated devices in the field of optical communications, quantum photonics, biochemical sensing, and more.
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