铁电性
材料科学
无定形固体
极化（电化学）
薄膜
纳米技术
压电响应力显微镜
化学物理
光电子学
结晶学
电介质
化学
物理化学
作者
Muhammad Sheeraz,Chang Won Ahn,Nguyen Xuan Duong,Sung Woo Hwang,Ji‐Soo Jang,Eun‐Young Kim,Yoon Ki Kim,Jae-Yeong Lee,Jong Sung Jin,Jong‐Seong Bae,Myang Hwan Lee,Hyoung‐Su Han,Gi‐Yeop Kim,Shinuk Cho,Tae Kwon Song,Sang Mo Yang,Sang Don Bu,Seung‐Hyub Baek,Si‐Young Choi,Ill Won Kim,Tae Heon Kim
标识
DOI：10.1002/advs.202408784
摘要
Understanding microscopic mechanisms of polarization retention characteristics in ferroelectric thin films is of great significance for exploring unusual physical phenomena inaccessible in the bulk counterparts and for realizing thin-film-based functional electronic devices. Perovskite (K,Na)NbO
科研通智能强力驱动
Strongly Powered by AbleSci AI
模糊中正
杳鸢
劲秉
嗯哼
5度转角
Candice
王一博
菠萝菠萝哒
无名老大
方羽
Loooong
不配.
VDC
自信项链
丰知然
chen
Ruichen.Wang
cdercder
蜡笔小鑫
cocolu
皖公网安备34019202002308
