X射线探测器
X射线
探测量子效率
探测器
平板
数字射线照相术
光电子学
光学
物理
半导体探测器
电子
半导体
灵敏度(控制系统)
材料科学
平板探测器
射线照相术
图像(数学)
计算机科学
图像质量
核物理学
电子工程
工程类
人工智能
作者
Safa Kasap,M. Z. Kabir,J. A. Rowlands
标识
DOI:10.1016/j.cap.2005.11.001
摘要
Recent research on flat panel X-ray image detectors has shown their potential for replacing existing X-ray film/screen cassettes and capturing X-ray images electronically, thus enabling the clinical transition to digital radiography. The present work examines the imaging properties of a number of potential X-ray photoconductors for these new X-ray image detectors. The X-ray sensitivity is discussed in terms of the absorption efficiency, electron–hole pair creation energy (ionization energy), and charge transport and trapping limited collection efficiency. X-ray photoconductor properties of various semiconductors are compared and critically discussed with special attention to stabilized a-Se and HgI2, currently the most promising materials.
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