回复反射器
光学
遥感
度量(数据仓库)
测量仪器
航程(航空)
杂散光
辐射测量
师(数学)
计算机科学
物理
航空航天工程
工程类
数学
地质学
激光器
数据库
算术
热力学
作者
K. L. Eckerle,Jack J. Hsia,Victor R. Weidner,William H. Venable
出处
期刊:Applied optics
[The Optical Society]
日期:1980-04-15
卷期号:19 (8): 1253-1253
被引量:8
摘要
A long-range retroreflectance instrument has been built in the photometric range of the Radiometric Physics Division of the NBS. It is designed to measure photometric properties of retroreflectors for different geometries. It satisfies many needs of the measurement community, and it is planned to use this instrument as the basis for a Measurement Assurance Program (MAP) and for Standard Reference Materials (SRM). This paper describes the design and testing of the instrument. Some estimated uncertainties for typical samples are given.
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