氧烷
扩展X射线吸收精细结构
无定形固体
骨料(复合)
材料科学
谱线
碱-硅反应
结晶学
化学
吸收光谱法
纳米技术
物理
光学
天文
作者
L. Khouchaf,Jan Verstraete,Rogério Junqueira Prado,M.-H. Tuilier
标识
DOI:10.1238/physica.topical.115a00552
摘要
In this work, we analyze and correlate information obtained from XANES, EXAFS and NMR on a SiO2 aggregate attacked by Alkali Silica Reaction (ASR). EXAFS and XANES results enable local order evaluation during the amorphization process within the aggregate. NMR results show the presence of amorphous and crystalline phases of silica during ASR attack. Besides, theoretical simulations of XANES spectra were performed and the atomic structure that generates the peak located 8 eV above the white-line (feature C in the text) was identified. The results lead us to deduce a change in the local order around silicon.
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