光电探测器
石墨烯
光电子学
响应度
材料科学
红外线的
硅
宽带
紫外线
载流子
光学
纳米技术
物理
作者
Wei Liu,Jianhang Lv,Peng Li,Hongwei Guo,Chen Liu,Yilun Liu,Wei Li,Lingfei Li,Lixiang Liu,Peiqi Wang,Srikrishna Chanakya Bodepudi,Khurram Shehzad,Guohua Hu,Kaihui Liu,Zhipei Sun,Tawfique Hasan,Yang Xu,Xiaomu Wang,Chao Gao,Yukui Zhang,Xiangfeng Duan
标识
DOI:10.1038/s41928-022-00755-5
摘要
Charge-coupled devices are widely used imaging technologies. However, their speed is limited due to the complex readout process, which involves sequential charge transfer between wells, and their spectral bandwidth is limited due to the absorption limitations of silicon. Here we report graphene charge-injection photodetectors. The devices have a deep-depletion silicon well for charge integration, single-layer graphene for non-destructive direct readout and multilayer graphene for infrared photocharge injection. The photodetectors offer broadband imaging from ultraviolet (around 375 nm) to mid-infrared (around 3.8 μm), a conversion gain of 700 pA per electron, a responsivity above 0.1 A W−1 in the infrared region and a fast response time under 1 μs.
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