Dielectric Properties of Zr-Doped CCTO Based Ceramics Prepared via Sol-Gel Method

The CaCu3Ti4O12 and Zr-doped polycrystalline CaCu3Zr0.05Ti3.95O12 were prepared via sol-gel method. Comprehensive characterization including X-ray diffraction (XRD) and field emission scanning electron microscopy (FE-SEM) equipped with Energy-dispersive X-ray spectroscopy (EDX) were employed to characterize the microstructure, morphology and composition. The dielectric properties of the CCTO based ceramics were studied using impedance analyzer. The results show that replacement of Zr in the Ti- site can achieve the effect of regulation of the dielectric properties.