石墨烯
材料科学
化学气相沉积
光电子学
响应度
光电探测器
肖特基势垒
图层(电子)
范德瓦尔斯力
光探测
纳米技术
异质结
石墨烯纳米带
基质(水族馆)
双层石墨烯
有机化学
化学
二极管
分子
作者
Tongxin Chen,Yuewen Sheng,Yingqiu Zhou,Ren‐Jie Chang,Xiaochen Wang,Hefu Huang,Qianyang Zhang,Linlin Hou,Jamie H. Warner
标识
DOI:10.1021/acsami.8b20321
摘要
We show that reducing the degree of van der Waals overlapping in all 2D ultrathin lateral devices composed of graphene:WS2:graphene leads to significant increase in photodetector responsivity. This is achieved by directly growing WS2 using chemical vapor deposition (CVD) in prepatterned graphene gaps to create epitaxial interfaces. Direct-CVD-grown graphene:WS2:graphene lateral photodetecting transistors exhibit high photoresponsivities reaching 121 A/W under 2.7 × 105 mW/cm2 532 nm illumination, which is around 2 orders of magnitude higher than similar devices made by the layer-by-layer transfer method. The photoresponsivity of our direct-CVD-grown device shows negative correlation with illumination power under different gate voltages, which is different from similar devices made by the transfer method. We show that the high photoresponsivity is due to the lowering of effective Schottky barrier height by improving the contact between graphene and WS2. Furthermore, the direct CVD growth reduces overlapping sections of WS2:Gr and leads to more uniform lateral systems. This approach provides insights into scalable manufacturing of high-quality 2D lateral electronic and optoelectronic devices.
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