解调
光子学
波长
锁(火器)
硅
光学
材料科学
光电子学
激光器
计算机科学
像素
物理
电信
工程类
机械工程
频道(广播)
作者
Neil Na,Szu-Lin Cheng,H.-D. Liu,Minglong Yang,C.-Y. Chen,H.-W. Chen,Ying-Nien Chou,C.-T. Lin,W.-H. Liu,Chongbin Liang,C.-L. Chen,Shi‐Wei Chu,B.-J. Chen,Yanjia Lyu,S.-L. Chen
出处
期刊:International Electron Devices Meeting
日期:2018-12-01
被引量:10
标识
DOI:10.1109/iedm.2018.8614707
摘要
We investigate and demonstrate the first Ge-on-Si lock-in pixels for indirect time-of-flight measurements. Compared to conventional Si lock-in pixels, such novel Ge-on-Si lock-in pixels simultaneously maintain a high quantum efficiency and a high demodulation contrast at a higher operation frequency, which enable consistently superior depth accuracies for both indoor and outdoor scenarios. System performances are evaluated, and pixel quantum efficiencies are measured to be >85% and >46% at 940nm and 1550nm wavelengths, respectively, along with demodulation contrasts measured to be >0.81 at 300MHz. Our work may open up new routes to high-performance indirect time-of-flight sensors and imagers, as well as potential adoptions of eye-safe lasers (e.g. wavelengths > 1.4μm)) for consumer electronics and photonics.
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