铁电性
反铁电性
材料科学
兴奋剂
极化(电化学)
硅
凝聚态物理
电介质
光电子学
物理化学
化学
物理
作者
Dominik Martin,Johannes Müller,Tony Schenk,Thomas M. Arruda,Amit Kumar,Evgheni Strelcov,Ekaterina Yurchuk,Stefan Müller,Darius Pohl,U. Schröder,Sergei V. Kalinin,Thomas Mikolajick
标识
DOI:10.1002/adma.201403115
摘要
Static domain structures and polarization dynamics of silicon doped HfO2 are explored. The evolution of ferroelectricity as a function of Si-doping level driving the transition from paraelectricity via ferroelectricity to antiferroelectricity is investigated. Ferroelectric and antiferroelectric properties can be observed locally on the pristine, poled and electroded surfaces, providing conclusive evidence to intrinsic ferroic behavior.
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