材料科学
吸收率
粒度
形态学(生物学)
溅射沉积
蓝移
表面粗糙度
腔磁控管
薄膜
表面光洁度
吸收(声学)
光学
复合材料
溅射
光电子学
反射率
纳米技术
光致发光
物理
生物
遗传学
作者
Zhaoqi Sun,Changlin Cao,Ling Cao,Ping Liang,Xingfa Huang,Xueping Song
出处
期刊:Vacuum
[Elsevier]
日期:2010-02-01
卷期号:84 (6): 828-832
被引量:12
标识
DOI:10.1016/j.vacuum.2009.11.002
摘要
Ultrathin Al films with different thicknesses were deposited on glass substrates by DC magnetron sputtering. The effects of film thickness on morphology and optical properties of the films were investigated in detail. When film thickness increases from 7.0 to 84.0 nm, the average grain size and surface roughness enlarges from 27.6 to 94.2 nm and from 0.25 to 1.87 nm, respectively. Below critical thickness of 28.0 nm, which is the thickness that Al films form continuous film, the optical properties vary significantly with thickness increasing and then tend to be stable. In the absorptance spectra, all films exhibit distinct broad peaks which can be attributed to the absorption due to the interband transition. The possible reasons for the shift in the peak position are due to the quantum size effects and internal stress in the ultrathin Al films.
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