拓扑绝缘体
材料科学
薄膜
基质(水族馆)
外延
纳米技术
光电子学
化学工程
凝聚态物理
物理
图层(电子)
海洋学
地质学
工程类
作者
Xin Cheng Yao,Jisoo Moon,S.‐W. Cheong,Seongshik Oh
出处
期刊:Nano Research
[Springer Nature]
日期:2020-06-22
卷期号:13 (9): 2541-2545
被引量:8
标识
DOI:10.1007/s12274-020-2894-6
摘要
Quality of epitaxial films strongly depends on their structural and chemical match with the substrates: The more closely they match, the better the film quality is. Topological insulators (TI) such as Bi2Se3 thin films are of no exception. However, there do not exist commercial substrates that match with TI films both structurally and chemically, at the level commonly available for other electronic materials. Here, we introduce BiInSe3 bulk crystal as the best substrate for Bi2Se3 thin films. These films exhibit superior surface morphology, lower defect density and higher Hall mobility than those on other substrates, due to structural and chemical match provided by the BiInSe3 substrate. BiInSe3 substrate could accelerate the advance of TI research and applications.
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