超短脉冲
衍射
材料科学
分辨率(逻辑)
X射线光电子能谱
原子物理学
能量(信号处理)
化学物理
分子物理学
光学
物理
核磁共振
激光器
计算机科学
量子力学
人工智能
作者
Hermann Erk,Clayton E. Jensen,Stephan Jauernik,Michael Bauer
标识
DOI:10.1103/physrevlett.133.226201
摘要
A novel method of ultrafast electron diffraction for the study of structural dynamics at surfaces is presented. The probing electron pulse is generated in the immediate vicinity of the surface by photoemission of low-energy electrons from the sample substrate. This limits the propagation distance of the electron pulse before diffraction to a few nanometers and thus minimizes pulse broadening effects due to space charge and dispersion. The experimentally proven time resolution of ≈100 fs exceeds reported values of conventional ultrafast low-energy electron diffraction by a factor of 10.
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