Surface Analysis: X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy

ADVERTISEMENT RETURN TO ISSUEPREVReviewNEXTSurface Analysis: X-ray Photoelectron Spectroscopy and Auger Electron SpectroscopyNoel H. Turner and John A. SchreifelsView Author Information Department of Chemistry, George Washington University, Washington, D.C. 20052 Department of Chemistry, George Mason University, Fairfax, Virginia 22030 Cite this: Anal. Chem. 2000, 72, 12, 99–110Publication Date (Web):May 18, 2000Publication History Published online18 May 2000Published inissue 1 June 2000https://pubs.acs.org/doi/10.1021/a10000110https://doi.org/10.1021/a10000110review-articleACS PublicationsCopyright © 2000 American Chemical SocietyRequest reuse permissionsArticle Views2598Altmetric-Citations44LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InRedditEmail Other access optionsGet e-Alertsclose SUBJECTS:Energy,Oxides,Thin films,X-ray photoelectron spectroscopy,X-rays Get e-Alerts