倒装芯片
焊接
互连
胶粘剂
共晶体系
数码产品
材料科学
电子包装
导电体
可靠性(半导体)
炸薯条
接触电阻
机械工程
电子工程
电气工程
工程类
复合材料
电信
图层(电子)
合金
功率(物理)
物理
量子力学
作者
J. Liu,K. Boustedt,Zonghe Lai
出处
期刊:Circuit World
[Emerald (MCB UP)]
日期:1996-08-01
卷期号:22 (2): 19-24
被引量:18
标识
DOI:10.1108/03056129610799949
摘要
Electronic packaging is increasingly becoming a vital part of the electronics industry, representing a key barrier to cost reduction and performance improvement. Of all the packaging methods, flip‐chip technology offers, up to now, the highest packaging density and best electrical performance. In this paper, flip‐chip test design considerations, process development and driving forces for adhesive joining and soldering flip‐chip processes will be given. Reliability test results of flip‐chip interconnection technology using conductive adhesive joining will also be presented. The electrical contact nature of the adhesive joint will be elaborated in the light of continuous and static electrical resistance measurement. Future research work directions in flip‐chip joining using eutectic solder and conductive adhesives on flexible circuits will also be discussed.
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