光学
材料科学
显微镜
激光器
显微镜
光学参量振荡器
红外线的
悬臂梁
分辨率(逻辑)
衍射
光电子学
物理
人工智能
计算机科学
复合材料
作者
G. A. Hill,James H. Rice,Stephen R. Meech,Duncan Q.M. Craig,Paulina S. Kuo,Konstantin L. Vodopyanov,Michael Reading
出处
期刊:Optics Letters
[Optica Publishing Group]
日期:2009-02-09
卷期号:34 (4): 431-431
被引量:31
摘要
Submicrometer IR surface imaging was performed with a resolution better than the diffraction limit. The apparatus was based on an IR optical parametric oscillator laser and a commercial atomic force microscope and used, as the detection mechanism, induced resonant oscillations in an atomic force microscopy (AFM) cantilever. For the first time to our knowledge this was achieved with top-down illumination and a benchtop IR source, thus extending the range of potential applications of this technique. IR absorption and AFM topography images of polystyrene beads were recorded simultaneously with an image resolution of 200 nm.
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