材料科学
雷登弗罗斯特效应
薄膜晶体管
基质(水族馆)
铟
氧化物
化学工程
薄膜
沸腾
电子迁移率
沉积(地质)
纳米技术
光电子学
冶金
核沸腾
热力学
图层(电子)
物理
海洋学
沉积物
地质学
生物
工程类
传热
古生物学
传热系数
作者
Ivan Isakov,Hendrik Faber,Max Grell,Gwenhivir Wyatt‐Moon,N. Pliatsikas,Th. Kehagias,G. P. Dimitrakopulos,P. Patsalas,Ruipeng Li,Thomas D. Anthopoulos
标识
DOI:10.1002/adfm.201606407
摘要
The growth mechanism of indium oxide (In 2 O 3 ) layers processed via spray pyrolysis of an aqueous precursor solution in the temperature range of 100–300 °C and the impact on their electron transporting properties are studied. Analysis of the droplet impingement sites on the substrate's surface as a function of its temperature reveals that Leidenfrost effect dominated boiling plays a crucial role in the growth of smooth, continuous, and highly crystalline In 2 O 3 layers via a vapor phase‐like process. By careful optimization of the precursor formulation, deposition conditions, and choice of substrate, this effect is exploited and ultrathin and exceptionally smooth layers of In 2 O 3 are grown over large area substrates at temperatures as low as 252 °C. Thin‐film transistors (TFTs) fabricated using these optimized In 2 O 3 layers exhibit superior electron transport characteristics with the electron mobility reaching up to 40 cm 2 V −1 s −1 , a value amongst the highest reported to date for solution‐processed In 2 O 3 TFTs. The present work contributes enormously to the basic understanding of spray pyrolysis and highlights its tremendous potential for large‐volume manufacturing of high‐performance metal oxide thin‐film transistor electronics.
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