极紫外光刻
望远镜
物理
光学
校准
同步加速器
X射线光学
探测器
波长
光学望远镜
天文
X射线
量子力学
作者
Jean-Marc Defise,Xueyan Song,J. P. Delaboudinière,G. Artzner,C. Carabétian,J.‐F. Hochedez,J. Brunaud,J. D. Moses,R. C. Catura,F. Clette,A. Maucherat
摘要
Optical characteristics in the wavelength range 15 - 75 nm of the EUV imaging telescope to be launched soon on the SOHO mission are discussed. Bandpasses and photometric sensitivity of the multilayered optics telescope have been measured by a dedicated synchrotron light source at Orsay, France.
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