绝缘体上的硅
材料科学
光电子学
CMOS芯片
基质(水族馆)
外延
兴奋剂
无线电频率
图层(电子)
硅
射频开关
电气工程
纳米技术
工程类
海洋学
地质学
作者
Hideki Takeuchi,R. J. Stephenson,B. H. Vine,K. Doran Weeks,N. W. Cody,Shuyi Li,Daniel Connelly,Robert J. Mears,G. Pfeiffer,C. Aulnette,Carole David,Hiu Yung Wong
标识
DOI:10.1109/edtm58488.2024.10511370
摘要
A novel SOI (silicon on insulator) substrate is proposed for RF switch and LNA device performance enhancement. The OI (oxygen insertion)-Si layer and the subsequent undoped Si layer epitaxially grown on a thin SOI starting substrate effectively retain boron in the SOI layer to enable formation of a SSR (super-steep retrograde) channel profile in a regular CMOS flow. The new SSROI substrate reduces body resistance for power handling improvement of RF switch, in addition to reducing the surface channel doping and thus impurity scattering for cutoff frequency improvement of LNA devices.
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