Characterization of Nb2O5, Ta2O5 and SiO2 single layers by spectrophotometry and ellipsometry

We compare the dispersion of refractive indexes for popular oxide materials (Nb 2 O 5 , Ta 2 O 5 , SiO 2 ) obtained by spectrophotometry and ellipsometry. We investigate how the difference between these two data sets impacts the design of filters and dispersive mirrors.