Optical and nonlinear optical study of KTa_052Nb_048O_3 epitaxial film

The second-order nonlinear optical coefficients d(33) , d(31) , and d(15) of KTa(0.52) Nb(0.48) O(3) epitaxial thin films grown upon MgO were studied by the standard Maker fringe method of an anisotropic medium. The measured d(33)=-84pm/V is 2.8 times the d(33) of LiNbO(3). The refractive indices n(e) and n(o) at several wavelengths were determined by TE and TM waveguide mode measurements. The data presented here point out the excellent qualities of KTa(1-x) Nb(x)O (3) films for use in integrated optics applications.