钝化
单晶硅
材料科学
载流子寿命
薄脆饼
硅
光电子学
解耦(概率)
电子工程
纳米技术
图层(电子)
工程类
控制工程
作者
Stefan W. Glunz,Martin Bivour,Christoph Messmer,Frank Feldmann,Ralph Müller,Christian Reichel,Armin Richter,Florian Schindler,Jan Benick,Martin Hermle
出处
期刊:2017 IEEE 44th Photovoltaic Specialist Conference (PVSC)
日期:2017-06-01
被引量:29
标识
DOI:10.1109/pvsc.2017.8366202
摘要
Effective passivating and carrier-selective contacts are based on the deposition of thin-film systems on the silicon wafer which results in a spatial decoupling of carrier generation and carrier separation in the device. They provide excellent passivation, high carrier selectivity and low contact resistivity. We have performed dedicated experiments to visualize these properties, thus allowing a better understanding of practical passivating and carrier-selective contact systems. Based on this analysis we recommend a measurement procedure to analyze carrier-selective contacts. The proper design of contact systems as the TOPCon structure and its careful implementation in a solar cell process featuring a simple both-sides contacted cell architecture allows to achieve excellent efficiencies of 25.7% and 21.9% on monocrystalline and multicrystalline silicon, respectively.
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