期刊:IEEE Electron Device Letters [Institute of Electrical and Electronics Engineers] 日期:2018-01-01卷期号:: 1-1被引量:24
标识
DOI:10.1109/led.2018.2865776
摘要
We demonstrate correlated oxide memory devices based on proton doping and re-distribution in perovskite nickelates (RNiO 3 , R = Sm, Nd) that undergo filling-controlled phase transition. Switching speeds as high as 30 ns in two-terminal devices patterned by electron-beam lithography is observed. The state switching speed reported here are $\sim 300\times $ greater than what has been noted with proton-driven resistance switching to date. The ionic-electronic correlated oxide memory devices also exhibit multi-state non-volatile switching. The results are of relevance to use of quantum materials in emerging memory and neuromorphic computing.