介电损耗
电介质
材料科学
凝聚态物理
薄膜
相(物质)
电极
相变
化学
光电子学
纳米技术
物理
物理化学
有机化学
作者
Hongcheng Li,Weidong Si,Alexander D. West,X. X. Xi
摘要
We have measured the dielectric loss in SrTiO3 thin films grown on SrRuO3 electrode layers with thickness ranging from 25 nm to 2.5 μm. The loss depends strongly on the thickness but differently above and below T≈80 K: as the thickness increases, the loss decreases at high temperatures but becomes higher at low temperatures. Our result suggests that, in the high temperature regime, the interfacial dead layer effect dominates while, in the low temperature regime, the losses related to the structural phase transition and quantum fluctuations are important.
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