硅氧烷
X射线光电子能谱
材料科学
分光计
芯(光纤)
聚合物
碳纤维
分析化学(期刊)
硅
谱线
工作(物理)
化学
复合材料
核磁共振
光学
有机化学
光电子学
物理
热力学
天文
复合数
作者
Pierre Louette,Frederic Bodino,Jean‐Jacques Pireaux
摘要
XPS measurements of poly(dimethyl siloxane) recorded with a SSX-100 spectrometer in standardized experimental conditions are presented: survey scan, high resolution core level spectra as well as the energy loss regions of carbon, oxygen, and silicon peaks are analyzed. This is part of a contract work aiming to record spectra in the very same conditions of some 40 different polymers.
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