热点(计算机编程)
杂质
扫描电子显微镜
冷斑
太阳能电池
红外线的
热成像
分析化学(期刊)
光学
材料科学
化学
物理
光电子学
复合材料
计算机科学
操作系统
有机化学
色谱法
天体生物学
作者
M. Simon,Edson L. Meyer
标识
DOI:10.1016/j.solmat.2009.09.016
摘要
In this study, infrared thermography (IR) was used to map the surface temperature distribution of solar cells while in the reverse bias mode. It was observed that some cells exhibited an inhomogeneity of the surface temperature resulting in localized heating (hot-spot). Using the scanning electron microscopy (SEM), the structural images of hot-spot areas revealed that hot-spot heating causes irreversible destruction of the solar cell structure. Different techniques were later used to analyze the elemental composition of the different regions of the solar cells. It was revealed that a direct correlation exists between areas of high impurity contaminants and hot-spot heating. Areas with high concentration of transition metals resulted in hot-spot formation. The results of all the samples are presented in detail in this paper.
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