Effect of vacancy defects on anisotropic electronic transport behaviors of CoN4C2 based 2D devices: a first-principles study

空位缺陷 材料科学 各向异性 单层 Atom(片上系统) 凝聚态物理 之字形的 电子结构 密度泛函理论 结晶学 纳米技术 计算化学 化学 物理 光学 几何学 数学 计算机科学 嵌入式系统
作者
Wenhao Yang,Tong Chen,Luzhen Xie,Yang Yu,Cheng Luo,Mengqiu Long
出处
期刊:Nanotechnology [IOP Publishing]
卷期号:35 (8): 085702-085702
标识
DOI:10.1088/1361-6528/ad0f53
摘要

Abstract The strong anisotropic electronic transport properties of the single-atom-thick material CoN 4 C 2 monolayer hold immense importance for the advancement of the electronics industry. Using density functional theory combined with non-equilibrium Green’s function systematically studied the electronic structural properties and anisotropic electronic transport properties of the CoN 4 C 2 monolayer. The results show that Co, N, and C single-atom vacancy defects do not change the electronic properties of the CoN 4 C 2 monolayer, which remains metallic. The pristine device and the devices composed of Co, N single-atom vacancy defects exhibit stronger electronic transport along the armchair direction than the zigzag direction, which exhibit strong anisotropy, and a negative differential resistance (NDR) effect can be observed. In contrast to the results mentioned above, the device with C single-atom vacancy defects only exhibits the NDR effect. Among them, the device with the N single-atom vacancy defect regime exhibits the strongest anisotropy, with an I Z / I A of up to 7.95. Moreover, based on the strongest anisotropy exhibited by N single-atom vacancy defects, we further studied the influence of different sites of the N-atom vacancy on the electronic transport properties of the devices. The results indicate that N-1, N-2, N-3, N-12, N-23, N-123, N-1234, and N-12345 model devices did not change the high anisotropy and NDR effect of the device, and among them the N-1234 exhibits the strongest anisotropy, the I Z / I A reaches 6.12. A significant NDR effect is also observed for the electronic transport along the armchair direction in these devices. However, the current gradually decreases as an increase of the number of N defects. These findings showcase the considerable potential for integration of the CoN 4 C 2 monolayer in switching devices and NDR-based multifunctional nanodevices.
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