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2340 积分 2023-10-11 加入
Reliability Characteristics of Ferroelectric $ \hbox{Si:HfO}_{2}$ Thin Films for Memory Applications
3天前
已完结
Integration and Electrical Properties of Ferroelectric Hf0.5Zr0.5O2 Thin Film on Bulk β-Ga2O3(-201) Substrate for Memory Applications
3天前
已完结
Improved Ferroelectric Switching Endurance of La-Doped Hf0.5Zr0.5O2 Thin Films
3天前
已完结
Nanosecond Polarization Switching and Long Retention in a Novel MFIS-FET Based on Ferroelectric $\hbox{HfO}_{2}$
3天前
已完结
Design optimization of a silicon-germanium heterojunction negative capacitance gate-all-around tunneling field effect transistor based on a simulation study
3天前
已完结
Investigation of Sidewall High-k Interfacial Layer Effect in Gate-All-Around Structure
6天前
已完结
Design optimization of a silicon-germanium heterojunction negative capacitance gate-all-around tunneling field effect transistor based on a simulation study
6天前
已完结
Nanosecond Polarization Switching and Long Retention in a Novel MFIS-FET Based on Ferroelectric $\hbox{HfO}_{2}$
7天前
已完结
Improved Ferroelectric Switching Endurance of La-Doped Hf0.5Zr0.5O2 Thin Films
7天前
已完结
Integration and Electrical Properties of Ferroelectric Hf0.5Zr0.5O2 Thin Film on Bulk β-Ga2O3(-201) Substrate for Memory Applications
7天前
已完结
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