电容
单层
量子电容
材料科学
晶体管
微分电容
光电子学
扩散电容
纳米技术
电压
化学
电气工程
电极
工程类
物理化学
作者
Robert K. A. Bennett,Eric Pop
出处
期刊:Nano Letters
[American Chemical Society]
日期:2023-02-14
卷期号:23 (5): 1666-1672
被引量:5
标识
DOI:10.1021/acs.nanolett.2c03913
摘要
When transistor gate insulators have nanometer-scale equivalent oxide thickness (EOT), the gate capacitance (CG) becomes smaller than the oxide capacitance (Cox) due to the quantum capacitance and charge centroid capacitance of the channel. Here, we study the capacitance of monolayer MoS2 as a prototypical two-dimensional (2D) channel while considering spatial variations in the potential, charge density, and density of states. At 0.5 nm EOT, the monolayer MoS2 capacitance is smaller than its quantum capacitance, limiting the single-gated CG of an n-type channel to between 63% and 78% of Cox, for gate overdrive voltages between 0.5 and 1 V. Despite these limitations, for dual-gated devices, the on-state CG of monolayer MoS2 is 50% greater than that of silicon at 0.5 nm EOT and more than three times that of InGaAs at 1 nm EOT, indicating that such 2D semiconductors are promising for improved gate control of nanoscale transistors at future technology nodes.
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