串扰
有机发光二极管
材料科学
物理
光学
纳米技术
图层(电子)
作者
Hannian Wang,Tianzhi Qin,Qi Shan,Genmao Huang,Xiujian Zhu,Zhili Ma,Guangyuan Sun,Xin Zhao,Guangxian Zhou
摘要
Based on a large number of measured data of line crosstalk, this paper focuses on the analysis of the mechanism of line crosstalk of single ram and dual ram products under the Empyrean circuit level simulation software, and verifies the relevant conclusions through simulation. By studying the causes of line crosstalk, various measures to improve this problem are put forward.
科研通智能强力驱动
Strongly Powered by AbleSci AI