价(化学)
准费米能级
半金属
氧化物
电负性
过渡金属
半导体
金属
凝聚态物理
无机化学
氧化剂
直接和间接带隙
材料科学
电子能带结构
化学物理
化学
催化作用
物理
带隙
光电子学
有机化学
生物化学
作者
Yong Xu,Martin A. A. Schoonen
出处
期刊:American Mineralogist
[Mineralogical Society of America]
日期:2000-03-01
卷期号:85 (3-4): 543-556
被引量:3364
摘要
The absolute energy positions of conduction and valence band edges were compiled for about 50 each semiconducting metal oxide and metal sulfide minerals. The relationships between energy levels at mineral semiconductor-electrolyte interfaces and the activities of these minerals as a catalyst or photocatalyst in aqueous redox reactions are reviewed. The compilation of band edge energies is based on experimental flatband potential data and complementary empirical calculations from electronegativities of constituent elements. Whereas most metal oxide semiconductors have valence band edges 1 to 3 eV below the H2O oxidation potential (relative to absolute vacuum scale), energies for conduction band edges are close to, or lower than, the H2O reduction potential. These oxide minerals are strong photo-oxidation catalysts in aqueous solutions, but are limited in their reducing power. Non-transition metal sulfides generally have higher conduction and valence band edge energies than metal oxides; therefore, valence band holes in non-transition metal sulfides are less oxidizing, but conduction band electrons are exceedingly reducing. Most transition-metal sulfides, however, are characterized by small band gaps (<1 eV) and band edges situated within or close to the H2O stability potentials. Hence, both the oxidizing power of the valence band holes and the reducing power of the conduction band electrons are lower than those of non-transition metal sulfides.
科研通智能强力驱动
Strongly Powered by AbleSci AI