Characterization of nanoparticles by scanning electron microscopy

Abstract In this chapter, sample preparation, image acquisition, and nanoparticle size and shape characterization methods using the scanning electron microscope (SEM) in reflective and transmitted working modes are described. These help in obtaining reliable, highly repeatable results. The best solutions vary case by case and depend on the raw (powdered or suspension) nanoparticle material, on the required measurement uncertainty, and on the performance of the SEM.